The influence of crystallographic orientation of nickel surface on oxidation inhibition by ceria coatings

被引:44
作者
Czerwinski, F [1 ]
Szpunar, JA [1 ]
机构
[1] McGill Univ, Dept Met Engn, Montreal, PQ H3A 2A7, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
D O I
10.1016/S1359-6454(97)00240-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The growth of NiO on (100) and (111) crystal faces of Ni, both pure and coated with nano-sized CeO2 particles, has been studied at temperatures in the range of 873-1073 K. It is shown that the crystallographic orientation of the substrate exerted an essential influence on the growth rate and microstructure of pure and CeO2-modified NiO. The 14 nm thick coatings of CeO2 deposited on (100)Ni markedly inhibited the oxidation process; however, oxide growth rate on this face was still higher than that measured for uncoated (111)Ni. The same coatings applied to (111)Ni, when incorporated into the oxide without the coarsening of CeO2 particles, decreased the oxidation rate to values as low as that predicted from the lattice diffusion of Ni in NiO. The differences in the oxidation rate of both Ni crystal faces are interpreted by the changes in oxide microstructure and texture, in terms of the type and density of grain boundaries. It is suggested that, at high temperatures, the NiO grain boundaries act as easy-diffusion paths for Ce4+ ions and primarily affect the distribution of relative element in oxide. Subsequently, the Ce4+ segregation affects the relative suppression of Ni2+ and O-2(-) diffusion, and the dominant oxidation mechanism. (C) 1998 Acta Metallurgica Inc.
引用
收藏
页码:1403 / 1417
页数:15
相关论文
共 28 条
[11]   The nanocrystalline ceria sol-Gel coatings for high temperature applications [J].
F. Czerwinski ;
J. A. Szpunar .
Journal of Sol-Gel Science and Technology, 1997, 9 (1) :103-114
[12]   THE GROWTH AND STRUCTURE OF THIN OXIDE-FILMS ON CERIA-SOL-COATED NICKEL [J].
CZERWINSKI, F ;
SMELTZER, WW .
OXIDATION OF METALS, 1993, 40 (5-6) :503-527
[13]   THE EARLY-STAGE OXIDATION-KINETICS OF CEO2 SOL-COATED NICKEL [J].
CZERWINSKI, F ;
SMELTZER, WW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1993, 140 (09) :2606-2615
[14]   AN O-18-SIMS STUDY OF OXIDE-GROWTH ON NICKEL MODIFIED WITH CE IMPLANTS AND CEO2 COATINGS [J].
CZERWINSKI, F ;
SPROULE, GI ;
GRAHAM, MJ ;
SMELTZER, WW .
CORROSION SCIENCE, 1995, 37 (04) :541-556
[15]   The growth and structure of thin oxide films on cerium ion-implanted nickel [J].
Czerwinski, F ;
Szpunar, JA ;
Smeltzer, WW .
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1996, 27 (11) :3649-3661
[17]   COMPUTER-SIMULATION OF (001) TILT GRAIN-BOUNDARIES IN NICKEL-OXIDE [J].
DUFFY, DM ;
TASKER, PW .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1983, 47 (06) :817-825
[18]   THEORETICAL-STUDIES OF DIFFUSION-PROCESSES DOWN COINCIDENT TILT BOUNDARIES IN NIO [J].
DUFFY, DM ;
TASKER, PW .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1986, 54 (06) :759-771
[19]   MECHANISM OF LOW-TEMPERATURE OXIDATION (23 DEGREES 450 DEGREES C) OF POLYCRYSTALLINE NICKEL [J].
GRAHAM, MJ ;
COHEN, M .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (07) :879-&
[20]   INFLUENCE OF OXIDE STRUCTURE ON OXIDATION RATE OF NICKEL SINGLE-CRYSTALS [J].
GRAHAM, MJ ;
HUSSEY, RJ ;
COHEN, M .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (11) :1523-1529