Nanobelts as nanocantilevers

被引：210

作者：

Hughes, WL ^{[1
]}

Wang, ZL ^{[1
]}

机构：

[1] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 17期

关键词：

Atomic force microscopy - Microelectromechanical devices - Nanotechnology - Zinc oxide;

D O I：

10.1063/1.1570497

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Semiconducting oxide nanobelts of ZnO have been sectioned and manipulated, for microelectromechanical systems, using an atomic force microscopy probe. Structurally modified nanobelts demonstrate potential for nanocantilever based technologies. With dimensions similar to35-1800 times smaller than conventional cantilevers, the nanocantilevers are expected to have improved physical, chemical, and biological sensitivity for scanning probe microscopy and sensor applications. (C) 2003 American Institute of Physics.

引用

页码：2886 / 2888

页数：3

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