Mechanical milling-induced deformation twinning in Fcc materials with high stacking fault energy

被引：40

作者：

He, JH ^{[1
]}

Chung, KH

Liao, XZ

Zhu, YT

Lavernia, EJ

机构：

[1] Univ Calif Davis, Dept Chem Engn & Mat Sci, Davis, CA 95616 USA

[2] Univ Calif Davis, Coll Engn, Davis, CA 95616 USA

来源：

METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 2003年 / 34卷 / 03期

关键词：

D O I：

10.1007/s11661-003-0106-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The high-resolution transmission electron microscopy (HRTEM) and X-ray diffraction (XRD) studies, as well as conventional transmission electron microscopy (TEM) observations, indicated the presence of a large number of highly twinned grains. The twinned structure was thought to be responsible for the higher creep resistance in the nanocrystalline Cu and Pd, because twin boundaries were poor paths for vacancy diffusion and resist grain boundary sliding. As such, the presence of deformations twins in several milled fcc metals and alloys with high stacking fault energy was observed using conventional TEM and HRTEM, and the density of twins was analyzed using X-ray diffraction (XRD).

引用

页码：707 / 712

页数：6

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