Characterisation of the topography and surface potential of electrodeposited conducting polymer films using atomic force and electric force microscopies

被引:58
作者
Barisci, JN [1 ]
Stella, R [1 ]
Spinks, GM [1 ]
Wallace, GG [1 ]
机构
[1] Univ Wollongong, Intelligent Polymer Res Inst, Wollongong, NSW 2522, Australia
关键词
conducting polymers; polypyrrole; electropolymerisation; atomic force microscopy; electric force microscopy; surface potential; work function;
D O I
10.1016/S0013-4686(00)00627-7
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Atomic force and electric force microscopies (AFM/EFM) have been used to characterise simultaneously the surface morphology and the surface potential (work function) of conducting polymer films. The technique is most valuable in allowing the local variations of surface potential to he mapped in the nanometer scale. Studies of electrochemically prepared polypyrrole films have shown that the work function in the grains is higher than it is in the surrounding areas suggesting a higher dopant concentration in the grains. The effect of polymer film thickness and polymerisation method on the surface potential was investigated. Electrochemical treatment of the polymer films did not change the topography but always changed the surface potential, although the magnitude and direction of the change depended on the polymer and experimental conditions. The surface potential distribution across the sample surface was similar for all cases investigated with the exception of polypyrrole/dodecylsulphate which exhibited changes in surface potential distribution when treated in a solution of its own dopant. In general, the magnitude of the surface potential changes appear to be due to a complex interplay of effects arising from the chemical nature of the dopant ion and the polymer. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:519 / 531
页数:13
相关论文
共 31 条
  • [1] In situ STM study of the counterion effect on the doping stages of polypyrrole films
    Chaînet, E
    Billon, M
    [J]. SYNTHETIC METALS, 1999, 99 (01) : 21 - 26
  • [2] Chao F, 1995, SYNTHETIC MET, V75, P85, DOI 10.1016/0379-6779(95)03395-Z
  • [3] PROPERTIES OF ELECTROCHEMICALLY SYNTHESIZED POLYMER ELECTRODES .10. STUDY OF POLYPYRROLE DODECYLBENZENE SULFONATE
    DEPAOLI, MA
    PERES, RCD
    PANERO, S
    SCROSATI, B
    [J]. ELECTROCHIMICA ACTA, 1992, 37 (07) : 1173 - 1182
  • [4] *DIG INSTR, 1996, 231 DIG INSTR
  • [5] Evans G. P., 1990, ADV ELEJCTROCHEMICAL, V1, P1
  • [6] Kelvin probe force microscopy of molecular surfaces
    Fujihira, M
    [J]. ANNUAL REVIEW OF MATERIALS SCIENCE, 1999, 29 : 353 - 380
  • [7] GANDHI M, 1995, POLYMER, V36, P4761
  • [8] HOLZL J, 1979, SOLID SURFACE PHYSIC
  • [9] Surface potential mapping: A qualitative material contrast in SPM
    Jacobs, HO
    Knapp, HF
    Muller, S
    Stemmer, A
    [J]. ULTRAMICROSCOPY, 1997, 69 (01) : 39 - 49
  • [10] Nernstian and non-nernstian potentiometry
    Janata, J
    Josowicz, M
    [J]. SOLID STATE IONICS, 1997, 94 (1-4) : 209 - 215