Heteroepitaxial growth of high-k gate oxides on silicon:: insights from first-principles calculations on Zr on Si(001)

被引:9
作者
Först, CJ
Blöchl, PE
Schwarz, K
机构
[1] Tech Univ Clausthal, Inst Theoret Phys, D-38678 Clausthal Zellerfeld, Germany
[2] Vienna Univ Technol, Inst Mat Chem, A-1060 Vienna, Austria
关键词
high-k oxides; heteroepitaxial growft; Si(100); Zr; DFT;
D O I
10.1016/S0927-0256(02)00427-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Metal deposition of Zr on a Si(001) surface has been studied by state-of-the-art electronic structure calculations. The energy per Zr adatom as a function of the coverage shows, that Zr forms silicide islands even at low coverages. Adsorbed Zr is thermodynamically unstable against the formation of bulk silicide ZrSi2. The observation that the islands consist of structural elements of the bulk silicide is an indication that silicide grains will form spontaneously. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:70 / 74
页数:5
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