Dependence of the pyroelectric response on internal stresses in ferroelectric thin films

被引：40

作者：

Ban, ZG ^{[1
]}

Alpay, SP

机构：

[1] Univ Connecticut, Dept Met & Mat Engn, Storrs, CT 06269 USA

[2] Univ Connecticut, Inst Sci Mat, Storrs, CT 06269 USA

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 20期

关键词：

D O I：

10.1063/1.1576503

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The role of internal stresses on the pyroelectric properties of ferroelectric thin films is analyzed theoretically via a thermodynamic model. The pyroelectric coefficient as a function of the misfit strain is calculated for (001) Ba0.6Sr0.4TiO3 epitaxial thin films. It is shown that this property is highly dependent on the misfit strain. A very large pyroelectric response (0.65 muC/cm(2) K) is theoretically predicted at a critical misfit strain (similar to-0.05%) corresponding to the ferroelectric to paraelectric phase transformation. The analysis shows that internal tensile stresses are particularly not desirable with significant degradation close to an order of magnitude in the pyroelectric response. (C) 2003 American Institute of Physics.

引用

页码：3499 / 3501

页数：3

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