Characterization of self-assembled monolayers of alkanethiol on GaAs surface by contact angle and angle-resolved XPS measurements

被引：63

作者：

Ye, S ^{[1
]}

Li, GF

Noda, H

Uosaki, K

Osawa, M

机构：

[1] Hokkaido Univ, Catalysis Res Ctr, Sapporo, Hokkaido 0600811, Japan

[2] Hokkaido Univ, Grad Sch Environm Earth Sci, Sapporo, Hokkaido 0600810, Japan

[3] Hokkaido Univ, Div Chem, Grad Sch Sci, Sapporo, Hokkaido 0600811, Japan

来源：

SURFACE SCIENCE | 2003年 / 529卷 / 1-2期

关键词：

self-assembly; X-ray photoelectron spectroscopy; gallium arsenide; ammonia;

D O I：

10.1016/S0039-6028(03)00239-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Self-assembled monolayers (SAMs) of alkanethiol molecules (CnH2n (+ 1) SH, n = 4, 8, 12, 18) have been constructed on a GaAs(100) surface in 5 mM alkanethiol/ethanol solutions with addition of ammonia (NH4OH). The contact angles of the GaAs surface modified by alkanethiol with longer chain (n greater than or equal to 12) were higher than 100degrees when the concentration of NH4OH in the modification solution was higher than 5%, showing a hydrophobic GaAs surface, which was covered by a well-ordered organic monolayer, was formed. Furthermore, the angle-resolved X-ray photoelectron spectroscopy measurements were carried out to determine chemical bonding, thickness and the tilt angle of the SAMs on the GaAs surface. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：163 / 170

页数：8

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