Atomic investigation of individual apexes of diamond emitters by a scanning atom probe

被引:13
作者
Nishikawa, O [1 ]
Sekine, T [1 ]
Ohtani, Y [1 ]
Maeda, K [1 ]
Numada, Y [1 ]
Watanabe, M [1 ]
机构
[1] Kanazawa Inst Technol, Dept Mat Sci & Engn, Kanazawa S 9218501, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 02期
关键词
D O I
10.1116/1.589917
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Diamonds grown by chemical vapor deposition and high-pressure high-temperature processes were mass analyzed by a newly developed scanning atom probe. The mass analysis of the diamonds revealed that the diamonds contain a large amount of hydrogen not only in the surface layer but also in the deep underlying layers and that carbon atoms form the clusters, C-3, C-5, C-8, and C-16 The clustering carbon atoms could be strongly bound in the diamond structure. The detection of a large number of neutral particles indicates that most cluster ions were decomposed into a positive ion and a neutral particle immediately after field evaporation. The interesting finding is that most carbon atoms are field ionized as multi-ionized ions such as C2+, C3+, and C4+ and/or CH2+, CH3+, and CH4+ with the mass peak of H+, while the major mass peaks are C+ and/or CH+ when no hydrogen peak is found. This may suggest that the binding state of carbon atoms in the diamonds varies with the binding state with hydrogen atoms. (C) 1998 American Vacuum Society. [S0734-211X(98)02602-X].
引用
收藏
页码:836 / 840
页数:5
相关论文
共 8 条
[1]   7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123
[2]   Pulsed ion beam characterization of CVD diamond surfaces under thin film deposition conditions [J].
Krauss, AR ;
Im, J ;
Schultz, JA ;
Smentkowski, VS ;
Waters, K ;
Zuiker, CD ;
Gruen, DM ;
Chang, RPH .
THIN SOLID FILMS, 1995, 270 (1-2) :130-136
[3]   TOWARD A SCANNING ATOM-PROBE - COMPUTER-SIMULATION OF ELECTRIC-FIELD [J].
NISHIKAWA, O ;
KIMOTO, M .
APPLIED SURFACE SCIENCE, 1994, 76 (1-4) :424-430
[4]   DEVELOPMENT OF A SCANNING ATOM-PROBE [J].
NISHIKAWA, O ;
KIMOTO, M ;
IWATSUKI, M ;
ISHIKAWA, Y .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (02) :599-602
[5]   Performance of the trial scanning atom probe: New approach to evaluate the microtip apex [J].
Nishikawa, O ;
Iwatsuki, M ;
Aoki, S ;
Ishikawa, Y .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (03) :2110-2113
[6]   ATOMIC CONFIGURATIONS OF TIP APEXES AND SCANNING TUNNELING MICROSCOPY-SPECTROSCOPY [J].
NISHIKAWA, O ;
TOMITORI, M ;
IWAWAKI, F .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1991, 8 (02) :81-97
[7]  
NISHIKAWA O, IN PRESS APPL PHYS A
[8]   FIELD-ION IMAGE-FORMATION [J].
TSONG, TT .
SURFACE SCIENCE, 1978, 70 (01) :211-233