Dependence of the quality of thick resist structures on resist baking

被引:8
作者
Bleidiessel, G
Gruetzner, G
Reuther, F
Fehlberg, S
Loechel, B
Maciossek, A
机构
[1] Micro Resist Technol GMBH, D-12555 Berlin, Germany
[2] Fraunhofer Inst Siliziumtechnol, ISIT, D-14199 Berlin, Germany
关键词
D O I
10.1016/S0167-9317(98)00100-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Interest in thick photoresist applications is steadily growing. Specialised equipment has been developed to cope with the new challenges to process and pattern extremely thick photoresist layers. A decisive step in the preparation of resist layers is the prebaking. The impact of three different prebaking technologies on the resist performance has been investigated. Resist patterns obtained after oven, hotplate or IR prebaking exhibit equal high quality. Compared to oven and hotplate baking the process length and energy consumption is markedly reduced using IR radiation favouring this variant to be the optimum prebaking process for very thick photoresist layers.
引用
收藏
页码:433 / 436
页数:4
相关论文
共 8 条
[1]  
DESPONT M, 1997, P 10 IEEE WORKSH MEM
[2]  
ENGELMANN G, 1990, P C MICR TECHN, P435
[3]  
Gobet J., 1993, Journal of Micromechanics and Microengineering, V3, P123, DOI 10.1088/0960-1317/3/3/007
[4]  
Loechel B, 1996, P SOC PHOTO-OPT INS, V2879, P174, DOI 10.1117/12.251205
[5]  
LOECHEL B, 1996, J ELECTROCHEM SOC, V143, P237
[6]  
Loechel B., 1994, MICROELECTRONIC ENG, V23, P455
[7]   GALVANOPLATING AND SACRIFICIAL LAYERS FOR SURFACE MICROMACHINING [J].
MACIOSSEK, A ;
LOCHEL, B ;
QUENZER, HJ ;
WAGNER, B ;
SCHULZE, S ;
NOETZEL, J .
MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) :503-508
[8]   MICROFABRICATION OF COMPLEX SURFACE TOPOGRAPHIES USING GREY-TONE LITHOGRAPHY [J].
WAGNER, B ;
QUENZER, HJ ;
HENKE, W ;
HOPPE, W ;
PILZ, W .
SENSORS AND ACTUATORS A-PHYSICAL, 1995, 46 (1-3) :89-94