Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method

被引:9
作者
Fukuma, T [1 ]
Kimura, K
Kobayashi, K
Matsushige, K
Yamada, H
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan
[2] Kyoto Univ, Int Innovat Ctr, Kyoto 6068501, Japan
基金
日本科学技术振兴机构;
关键词
D O I
10.1063/1.1842368
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a dynamic force microscope (DFM) with a wideband cantilever deflection sensor using heterodyne optical beam deflection (HOBD) method. The bandwidth of HOBD method is limited only by the maximum frequency for laser power modulation, which can be as high as gigahertz order. This technique allows us to use high cantilever resonance frequencies for improving the sensitivity and time response of DFM. In this letter, basic principle and experimental setup of HOBD method are described. Deflection measurement of a cantilever vibration at about 7 MHz is demonstrated. Using this cantilever, DFM imaging with a relatively fast scanning speed is performed. (C) 2004 American Institute of Physics.
引用
收藏
页码:6287 / 6289
页数:3
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