Amorphous silicon air-gap resonators on large-area substrates

被引:34
作者
Boucinha, M
Brogueira, P
Chu, V
Conde, JP
机构
[1] Inst Engn Sistemas & Comp, P-1000029 Lisbon, Portugal
[2] Univ Tecn Lisboa, Dept Phys, Inst Super Tecn, P-1049001 Lisbon, Portugal
[3] Univ Tecn Lisboa, Dept Mat Engn, Inst Super Tecn, P-1049001 Lisbon, Portugal
关键词
D O I
10.1063/1.1306912
中图分类号
O59 [应用物理学];
学科分类号
摘要
Air-gap resonators composed of bridges of hydrogenated amorphous silicon and aluminum bilayers on glass and polyethylene terephthalate substrates are realized using surface micromachining techniques. The resonance frequency of structures on plastic substrates was found to vary inversely with the square of the length of the bridge span. On glass substrates, this dependence is seen for lengths > 100 mu m, while for lengths < 100 mu m, a decrease in the frequency is attributed to compressive stress. Resonance frequencies of similar to 500 kHz to similar to 2 MHz were measured in bridges with lengths from 160 mu m down to similar to 80 mu m. (C) 2000 American Institute of Physics. [S0003-6951(00)03732-3].
引用
收藏
页码:907 / 909
页数:3
相关论文
共 13 条
[1]   Air-gap amorphous silicon thin film transistors [J].
Boucinha, M ;
Chu, V ;
Conde, JP .
APPLIED PHYSICS LETTERS, 1998, 73 (04) :502-504
[2]   Application of thin-film micromachining for large-area substrates [J].
Boucinha, M ;
Chu, V ;
Soares, V ;
Conde, JP .
AMORPHOUS AND HETEROGENEOUS SILICON THIN FILMS: FUNDAMENTALS TO DEVICES-1999, 1999, 557 :799-807
[3]   Measurement of mechanical resonance and losses in nanometer scale silicon wires [J].
Carr, DW ;
Evoy, S ;
Sekaric, L ;
Craighead, HG ;
Parpia, JM .
APPLIED PHYSICS LETTERS, 1999, 75 (07) :920-922
[4]  
De Los Santos H.J., 1999, INTRO MICROELECTROME
[5]   Nanofabrication and electrostatic operation of single-crystal silicon paddle oscillators [J].
Evoy, S ;
Carr, DW ;
Sekaric, L ;
Olkhovets, A ;
Parpia, JM ;
Craighead, HG .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (11) :6072-6077
[6]   SURFACE MICROMACHINING FOR MICROSENSORS AND MICROACTUATORS [J].
HOWE, RT .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (06) :1809-1813
[7]   DETERMINATION OF YOUNG MODULI OF MICROMECHANICAL THIN-FILMS USING THE RESONANCE METHOD [J].
KIESEWETTER, L ;
ZHANG, JM ;
HOUDEAU, D ;
STECKENBORN, A .
SENSORS AND ACTUATORS A-PHYSICAL, 1992, 35 (02) :153-159
[8]   Silicon microstructuring technology [J].
Lang, W .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 1996, 17 (01) :1-55
[9]  
Maluf N., 2000, INTRO MICROELECTROME
[10]  
Shames I.H. C.L. Dym., 1985, ENERGY FINITE ELEMEN