Atomic scale studies of silver segregation at {222}MgO/Cu heterophase interfaces

被引：5

作者：

Shashkov, DA ^{[1
]}

Seidman, DN ^{[1
]}

机构：

[1] NORTHWESTERN UNIV,MAT RES CTR,EVANSTON,IL 60208

来源：

INTERGRANULAR AND INTERPHASE BOUNDARIES IN MATERIALS, PT 1 | 1996年 / 207-卷

关键词：

Cu/MgO; internal oxidation; precipitate; ceramic/metal interface; atom-probe field-ion microscopy; equilibrium segregation; Gibbsian interfacial excess;

D O I：

10.4028/www.scientific.net/MSF.207-209.429

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Atom-probe field-ion microscopy (APFIM) was used to measure quantitatively the absolute values of the Gibbsian interfacial excess of Ag, Gamma(Ag), at semi-coherent {222} MgO/Cu(Ag) heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg, Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter and faceted on {222} panes, in a single-phase Cu(Ag) matrix. The measured value of Gamma(Ag), at 500 degrees C is (2+/-0.6)x10(15) atoms cm(-2).

引用

页码：429 / 432

页数：4

共 21 条

[1] COARSENING BEHAVIOUR OF THETA'' AND THETA' PRECIPITATES IN 2 AL-CU ALLOYS [J].