Deep reactive ion etching characteristics of a macromachined chemical reactor

被引:21
作者
Besser, RS [1 ]
Shin, WC [1 ]
机构
[1] Stevens Inst Technol, Hoboken, NJ 07030 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2003年 / 21卷 / 02期
关键词
D O I
10.1116/1.1560162
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
While deep reactive ion etching using an inductively coupled plasma (ICP) source has proven to be a boon to the fabrication of silicon-based microelectromechanical systems, the process is highly sensitive to the geometry of any given device and needs to be modified accordingly. For a chemical microreactor involving fluidic structures of highly varying geometry on the same device, the implementation of ICP etching can be especially challenging. We present the results of a study of one such implementation. (C) 2003 American Vacuum Society. [DOI: 10. 1116/1.1560162].
引用
收藏
页码:912 / 915
页数:4
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