Cumulative effects of Te precipitates in CdZnTe radiation detectors

被引:88
作者
Bolotnikov, A. E. [1 ]
Camarda, G. S.
Carini, G. A.
Cui, Y.
Li, L.
James, R. B.
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
[2] Yinnel Tech Inc, South Bend, IN 46619 USA
关键词
CdZnTe detectors; Te precipitates; electron diffusion;
D O I
10.1016/j.nima.2006.11.023
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
High-quality radiation detector-grade CdZnTe material is free from large-scale defects, such as grain boundaries, twins, and large Te or Cd inclusions (> 50 mu m), although it usually Contains high concentrations of uniformly distributed Te inclusions and precipitates. typically of similar to 20-mu m-diameter size or smaller. We address the effects of the small-size Te precipitates on charge collection in CZT detectors, the significance of which is not yet well characterized. The strong correlation that we earlier found between the high-resolution X-ray maps and IR images proved that even small Te precipitates call trap substantial fractions of charge from the electron cloud. In this work, we modeled the transport or an electron cloud across idealized CZT devices containing Te precipitates to demonstrate that their cumulative effect can explain the degradation of energy resolution and the detection efficiency losses observed in actual CZT devices. Due to lack of experimental data oil how the Te precipitates interact with an electron cloud. we developed a simplified (phenomenological) model based oil the geometrical aspects of the problem. Despite its simplicity, the model correctly reproduced many experimental facts and gave quantitative predictions oil the extent to which the presence of Te precipitates and inclusions can be tolerated. The broadening of the electron clond due to repulsion and diffusion is at the core of the problem., making even low concentrations of small precipitates important in the device's performance.
引用
收藏
页码:687 / 698
页数:12
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