Stable integration of isolated cell membrane patches in a nanomachined aperture

被引:63
作者
Fertig, N
Tilke, A
Blick, RH
Kotthaus, JP
Behrends, JC
ten Bruggencate, G
机构
[1] Univ Munich, Ctr Nanosci, D-80539 Munich, Germany
[2] Univ Munich, Sekt Phys, D-80539 Munich, Germany
[3] Univ Munich, Inst Physiol, D-803369 Munich, Germany
关键词
D O I
10.1063/1.1289490
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a method for integrating an isolated cell membrane patch into a semiconductor device. The semiconductor is nanostructured for probing native cell membranes for scanning probe microscopy in situ. Apertures were etched into suspended silicon-nitride layers on a silicon substrate using standard optical lithography as well as electron-beam lithography in combination with reactive ion etching. Apertures of 1 mu m diam were routinely fabricated and a reduction in size down to 50 nm was achieved. The stable integration of cell membranes was verified by confocal fluorescence microscopy in situ. (C) 2000 American Institute of Physics. [S0003-6951(00)01834-9].
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页码:1218 / 1220
页数:3
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