Electronic charge reconstruction of doped Mott insulators in multilayered nanostructures

被引:16
作者
Chen, Ling [1 ]
Freericks, J. K. [1 ]
机构
[1] Georgetown Univ, Dept Phys, Washington, DC 20057 USA
关键词
D O I
10.1103/PhysRevB.75.125114
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Dynamical mean-field theory is employed to calculate the electronic charge reconstruction of multilayered inhomogeneous devices composed of semi-infinite metallic lead layers sandwiching barrier planes of a strongly correlated material (that can be tuned through the metal-insulator Mott transition). The main focus is on barriers that are doped Mott-insulators, and how the electronic charge reconstruction can create well-defined Mott insulating regions in a device whose thickness is governed by intrinsic materials properties, and hence may be able to be reproducibly made.
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页数:8
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