Near-field scanning optical microscopy of photonic crystal nanocavities

被引：42

作者：

Okamoto, K ^{[1
]}

Loncar, M

Yoshie, T

Scherer, A

Qiu, YM

Gogna, P

机构：

[1] CALTECH, Dept Elect Engn, Pasadena, CA 91125 USA

[2] CALTECH, Jet Prop Lab, Situ Technol & Expt Syst Sect, Pasadena, CA 91109 USA

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 11期

关键词：

D O I：

10.1063/1.1559646

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Near-field scanning optical microscopy was used to observe high-resolution images of confined modes and photonic bands of planar photonic crystal (PPC) nanocavities fabricated in active InGaAsP material. We have observed the smallest optical cavity modes, which are intentionally produced by fractional edge dislocation high-Q cavity designs. The size of the detected mode was roughly four by three lattice spacings. We have also observed extended dielectric-band modes of the bulk PPC surrounding the nanocavity by geometrically altering the bands in emission range and eliminating localized modes out of the emission range. (C) 2003 American Institute of Physics.

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页码：1676 / 1678

页数：3

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