Spray pyrolysis deposition of lanthanum telluride thin films and their characterizations

被引：7

作者：

Bagde, GD ^{[1
]}

Sartale, SD ^{[1
]}

Lokhande, CD ^{[1
]}

机构：

[1] Shivaji Univ, Dept Phys, Thin Film Phys Lab, Kolhapur 416004, Maharashtra, India

来源：

MATERIALS CHEMISTRY AND PHYSICS | 2005年 / 89卷 / 2-3期

关键词：

spray pyrolysis; La2Te3; X-ray diffraction; optical absorption; resistivity; thermoemf;

D O I：

10.1016/j.matchemphys.2004.09.022

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Spray pyrolysis method is used to deposit lanthanum telluride (La2Te3) thin films on glass substrates. The films are deposited by pyrolysis of sprayed solutions of LaCl3 and Te metal dissolved in concentrated HCl and HNO3 along with hydrazine hydrate as a reducing agent. X-ray diffraction analyses show that the films are polycrystalline with La2Te3 phase. The films have a direct optical band gap of 2.2 eV. The films are p-type semiconductors with an electrical resistivity of the order of 10(4) Omega cm at ambient temperature (27 degreesC). (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：402 / 405

页数：4

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