Electric field induced structural change for poly(vinylidene fluoride-co-trifluoroethylene) ultrathin films studied by scanning Maxwell stress microscope

被引：21

作者：

Kajiyama, T ^{[1
]}

Khuwattanasil, N ^{[1
]}

Takahara, A ^{[1
]}

机构：

[1] Kyushu Univ, Grad Sch Engn, Dept Mat Phys & Chem, Higashi Ku, Fukuoka 81281, Japan

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 01期

关键词：

D O I：

10.1116/1.589765

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Poly(vinylidene fluoride-co-trifluoroethylene) [P(VDF/TrFE), VDF 75 mel %] ultrathin films of 10 nm thickness were prepared on gold coated silicon wafer substrates by a spin-coating method and their aggregation states were investigated by Fourier transform infrared reflection absorption spectroscopic measurement. It was found that P(VDF/TrFE) formed a ferroelectric phase even in a confined state such as an ultrathin film. The electric field was locally imposed on the ultrathin film through a gold coated cantilever tip. The change of dipole moment orientation of P(VDF/TrFE) was evaluated by measuring surface potential change, performed by scanning Maxwell stress microscopy (SMM). The SMM images revealed that the local dipole moment orientation of P(VDF/TrFE) in ultrathin films could be changed by an application of electric field through an atomic force microscope tip. (C) 1998 American Vacuum Society.

引用

页码：121 / 124

页数：4

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