Alignment and nano-connections of isolated carbon nanotubes

被引：6

作者：

Sagnes, M

Broto, JM

Raquet, B

Ondarçuhu, T

Laurent, C

Flahaut, E

Vieu, C

Carcenac, F

机构：

[1] LNCMP, LPMC, F-31432 Toulouse 4, France

[2] CEMES, F-31055 Toulouse, France

[3] Univ Toulouse 3, CNRS, UMR 5085, CIRIMAT, F-31062 Toulouse, France

[4] LAAS, F-31077 Toulouse, France

来源：

MICROELECTRONIC ENGINEERING | 2003年 / 67-8卷

关键词：

carbon nanotubes; molecular combing; nanofabrication; electronic transport;

D O I：

10.1016/S0167-9317(03)00130-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report a new approach for the alignment and the electrical nano-connection of isolated carbon nanotubes (CNTs). Through a novel combination of proven technics, we have been able to align isolated carbon nanotubes and selectively contact those CNTs by high resolution electron beam lithography (HREBL). Resistance versus temperature (R(T)) experiments have been carried out to determine the reliability of the metal-CNTs interface and to probe the electronic conductance of the CNT. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：683 / 689

页数：7

共 9 条

[1] Contacting carbon nanotubes selectively with low-ohmic contacts for four-probe electric measurements [J].