共 19 条
- [3] INFRARED DIODE-LASER SPECTRUM OF THE NU-1 BAND OF CF2(X1A1) [J]. JOURNAL OF CHEMICAL PHYSICS, 1981, 75 (12) : 5602 - 5608
- [6] MEASUREMENTS OF RADICAL DENSITIES IN RADIOFREQUENCY FLUOROCARBON PLASMAS USING INFRARED-ABSORPTION SPECTROSCOPY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (06): : 3102 - 3108
- [7] Analysis of product species in capacitively coupled C5F8 plasma by electron attachment mass spectroscopy [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1999, 38 (8A): : L888 - L891
- [8] Surface reaction of CF2 radicals for fluorocarbon film formation in SiO2/Si selective etching process [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1998, 16 (01): : 233 - 238
- [9] Ito Y., 1998, P 20 S DRY PROC I EL, P263