Radical kinetics for polymer film deposition in fluorocarbon (C4F8, C3F6 and C5F8) plasmas

被引:78
作者
Takahashi, K [1 ]
Itoh, A [1 ]
Nakamura, T [1 ]
Tachibana, K [1 ]
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
关键词
fluorocarbon film; plasma polymerization; low GWP alternative gas; C5F8; C4F8; C3F6; radical measurement;
D O I
10.1016/S0040-6090(00)01160-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Film deposition mechanisms were investigated in capacitively-coupled plasmas of fluorocarbon (C4F8, C3F6 and C5F8) gases. In a C5F8 plasma, slightly fluorine-rich film was obtained and the deposition rate was twice as large as those in C4F8 and C3F6 plasmas. In order to understand such a different behavior in the film deposition, densities of the gas-phase species were measured by infrared laser absorption spectroscopy (IRLAS). Densities of smaller mass radicals such as CF, CF, and CF, were on the order of 10(10), 10(12) and 10(11) cm(-3), respectively, in every source gas but had no direct correlation with the deposition tendency. Stable molecules such as CF4 and C2F6 were also produced in every gas, but the quantities were smallest in a C5F8 plasma. This indicates that polymerization reactions in the gas phase and on the surface were suppressed in producing the stable species in C4F8 and C3F6 plasmas. The presence of high-mass and less-stable species in the gas phase in a C5F8 plasma was suggested to be responsible for the deposition of polymers with a higher rate and larger fluorine content. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:303 / 310
页数:8
相关论文
共 19 条
  • [1] Investigation of the low-pressure plasma-chemical conversion of fluorocarbon waste gases
    Breitbarth, FW
    Berg, D
    Dumke, K
    Tiller, HJ
    [J]. PLASMA CHEMISTRY AND PLASMA PROCESSING, 1997, 17 (01) : 39 - 57
  • [2] CF2 production and loss mechanisms in fluorocarbon discharges:: Fluorine-poor conditions and polymerization
    Cunge, G
    Booth, JP
    [J]. JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) : 3952 - 3959
  • [3] INFRARED DIODE-LASER SPECTRUM OF THE NU-1 BAND OF CF2(X1A1)
    DAVIES, PB
    LEWISBEVAN, W
    RUSSELL, DK
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1981, 75 (12) : 5602 - 5608
  • [4] Plasma deposition of low-dielectric-constant fluorinated amorphous carbon
    Endo, K
    Shinoda, K
    Tatsumi, T
    [J]. JOURNAL OF APPLIED PHYSICS, 1999, 86 (05) : 2739 - 2745
  • [5] Measurements of CFx and SiHx radicals in ECR and RF plasmas used for material processing
    Goto, T
    [J]. PURE AND APPLIED CHEMISTRY, 1996, 68 (05) : 1059 - 1063
  • [6] MEASUREMENTS OF RADICAL DENSITIES IN RADIOFREQUENCY FLUOROCARBON PLASMAS USING INFRARED-ABSORPTION SPECTROSCOPY
    HAVERLAG, M
    STOFFELS, E
    STOFFELS, WW
    KROESEN, GMW
    DEHOOG, FJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (06): : 3102 - 3108
  • [7] Analysis of product species in capacitively coupled C5F8 plasma by electron attachment mass spectroscopy
    Imai, S
    Tachibana, K
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1999, 38 (8A): : L888 - L891
  • [8] Surface reaction of CF2 radicals for fluorocarbon film formation in SiO2/Si selective etching process
    Inayoshi, M
    Ito, M
    Hori, M
    Goto, T
    Hiramatsu, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1998, 16 (01): : 233 - 238
  • [9] Ito Y., 1998, P 20 S DRY PROC I EL, P263
  • [10] INFRARED DIODE-LASER SPECTROSCOPY OF THE CF RADICAL
    KAWAGUCHI, K
    YAMADA, C
    HAMADA, Y
    HIROTA, E
    [J]. JOURNAL OF MOLECULAR SPECTROSCOPY, 1981, 86 (01) : 136 - 142