A Dempster-Shafer approach for recognizing machine features from CAD models

被引:19
作者
Ji, Q [1 ]
Marefat, MM
机构
[1] Rensselaer Polytech Inst, Dept Elect & Comp Syst Engn, Troy, NY 12180 USA
[2] Univ Arizona, Dept Elect & Comp Engn, Tucson, AZ 85721 USA
基金
美国国家卫生研究院; 美国国家科学基金会; 美国国家航空航天局;
关键词
Dempster-Shafer theory; evidential reasoning; feature extraction; pattern recognition; geometric reasoning;
D O I
10.1016/S0031-3203(02)00260-1
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This paper introduces an evidential reasoning-based approach for recognizing and extracting manufacturing features from solid model description of objects. A major difficulty faced by previously proposed methods for feature extraction has been the interaction between features due to non-uniqueness and ambiguousness in feature representation. To overcome this difficulty, we introduce a Dempster Shafer approach for generating and combining geometric and topologic evidences to identify and extract interacting features. The main contributions of this research include introducing different classes of evidences based on the geometric and topologic relationships at different abstraction levels for effective evidential reasoning and developing the principle of association to overcome the mutual exclusiveness assumption of the Dempster-Shafer theory. Experiments demonstrate the effectiveness of the proposed approach in extracting interacting machine features. (C) 2003 Pattern Recognition Society. Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1355 / 1368
页数:14
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