Surface plasmon waveguide Schottky detector

被引:145
作者
Akbari, Ali [1 ]
Tait, R. Niall [2 ]
Berini, Pierre [1 ,3 ,4 ]
机构
[1] Univ Ottawa, Sch Informat Technol & Engn, Ottawa, ON K1N 6N5, Canada
[2] Carleton Univ, Dept Elect, Ottawa, ON K1S 5B6, Canada
[3] Univ Ottawa, Dept Phys, Ottawa, ON K1N 6N5, Canada
[4] Spectalis Corp, Ottawa, ON K2K 2P4, Canada
来源
OPTICS EXPRESS | 2010年 / 18卷 / 08期
关键词
HIGH SERIES RESISTANCE; INTERNAL PHOTOEMISSION; METAL STRIPES; BOUND MODES; DIODES; PROPAGATION; BARRIER; SILICON; OPTICS;
D O I
10.1364/OE.18.008505
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A surface plasmon polariton detector is demonstrated at infra-red wavelengths. The device consists of a metal stripe on silicon forming a Schottky contact thereon and supporting surface a plasmon polariton mode that is strongly confined and localised to the metal-semiconductor interface. Detection of optical radiation below the bandgap of silicon (at infrared wavelengths) occurs through internal photoemission. Responsivities of 0.38 and 1.04 mA/W were measured via end-fire coupling to a tapered optical fibre, at room temperature and at a wavelength of 1280 nm, for gold and aluminium stripes on n-type silicon, respectively. The device can be integrated with other structures used in nano-plasmonics, nano-photonics or silicon-based photonics, and it holds promise for short-reach optical interconnects and power monitoring applications. (C) 2010 Optical Society of America
引用
收藏
页码:8505 / 8514
页数:10
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