SCHOTTKY DIODES WITH HIGH SERIES RESISTANCE - LIMITATIONS OF FORWARD I-V METHODS

被引：150

作者：

AUBRY, V

MEYER, F

机构：

[1] Institut d'Electronique Fondamentale, URA CNRS 22, Université Paris Sud

来源：

JOURNAL OF APPLIED PHYSICS | 1994年 / 76卷 / 12期

关键词：

D O I：

10.1063/1.357909

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Some methods have been proposed to deduce the value of Schottky parameters from forward I-V characteristic even in the presence of a large series resistance. In this paper, some well-known methods have been applied to experimental data of a real diode and to computer calculated curves. A comparison is made between these methods and the standard procedure. Some indications are given on the validity and the main limitations of all these techniques. © 1994 American Institute of Physics.

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页码：7973 / 7984

页数：12

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