A SYSTEMATIC-APPROACH TO THE MEASUREMENT OF IDEALITY FACTOR, SERIES RESISTANCE, AND BARRIER HEIGHT FOR SCHOTTKY DIODES

A nongraphical approach is proposed for measuring and evaluating the ideality n factor and the series resistance of a Schottky diode. The approach involves the use of an auxiliary function and a computer-fitting routine. This technique has been found to be both accurate and reliable. The validity of this has also been confirmed by way of I-V measurements using both commercially available and laboratory-prepared Schottky diodes.