A study of the ITO-on-PPV interface using photoelectron spectroscopy

被引：57

作者：

Johansson, N

Cacialli, F

Xing, KZ

Beamson, G

Clark, DT

Friend, RH

Salaneck, WR ^{[1
]}

机构：

[1] Linkoping Univ, IFM, Dept Phys, S-51883 Linkoping, Sweden

[2] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England

[3] SERC, Daresbury Lab, Res Unit Surfaces Transforms & Interfaces, Warrington WA4 4AD, Cheshire, England

来源：

SYNTHETIC METALS | 1998年 / 92卷 / 03期

关键词：

poly(p-phenylene vinylene); photoelectron spectroscopy; interfaces;

D O I：

10.1016/S0379-6779(98)80088-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Angle-dependent photoelectron spectroscopy has been used to study some details of the chemistry at the interface between indium-tin-oxide, deposited by argon plasma sputtering, and poly(p-phenylene vinylene). We find chemical species corresponding to different oxidized states of poly(p-phenylene vinylene) and we discuss their assignment with reference to those produced in photo-oxidation experiments. (C) 1998 Elsevier Science S.A.

引用

页码：207 / 211

页数：5