Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si-SiO2 interface

被引：30

作者：

Azzam, RMA ^{[1
]}

Spinu, CL ^{[1
]}

机构：

[1] Univ New Orleans, Dept Elect Engn, New Orleans, LA 70148 USA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2004年 / 21卷 / 10期

关键词：

D O I：

10.1364/JOSAA.21.002019

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An achromatic infrared (lambda = 1.2-4 mum), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried S'-SiO2 interface at an angle of incidence theta near 33degrees, where partial derivativeDelta/partial derivativephi = 0. The retardance Delta deviates from 90degrees by <+/-2degrees within afield of view of +/-10degrees (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination. (C) 2004 Optical Society of America.

引用

页码：2019 / 2022

页数：4

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