Luminescence of as-grown and thermally annealed GaAsN/GaAs

被引:148
作者
Francoeur, S [1 ]
Sivaraman, G [1 ]
Qiu, Y [1 ]
Nikishin, S [1 ]
Temkin, H [1 ]
机构
[1] Texas Tech Univ, Dept Elect Engn, Lubbock, TX 79409 USA
关键词
D O I
10.1063/1.121206
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a study of the luminescence properties of coherently strained GaAs1-xNx grown on GaAs by metalorganic molecular beam epitaxy. Well-defined photoluminescence was observed in samples with a nitrogen concentration up to 3%. Samples subjected to thermal anneals, investigated by x-ray diffraction and photoluminescence, show increased nitrogen incorporation and significant improvements in the luminescence efficiency. A band-gap reduction of more than 400 meV, compared to GaAs, is observed for a nitrogen concentration of similar to 3%. For the range of nitrogen concentrations investigated here, the band gap follows predictions of the dielectric model of Van Vechten. (C) 1998 American Institute of Physics.
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页码:1857 / 1859
页数:3
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