The anisotropic dielectric function for copper phthalocyanine thin films

被引：49

作者：

Gordan, OD ^{[1
]}

Friedrich, M ^{[1
]}

Zahn, DRT ^{[1
]}

机构：

[1] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany

来源：

ORGANIC ELECTRONICS | 2004年 / 5卷 / 06期

关键词：

ellipsometry; infrared spectroscopy; optical anisotropy; organic molecular thin films; copper phthalocyanine;

D O I：

10.1016/j.orgel.2004.10.001

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Copper phthalocyanine (CuPc) thin films were prepared by organic molecular beam deposition (OMBD) in high vacuum and ultra-high vacuum on passivated Si(111) using beta-phase CuPc as source material. The substrates were kept at room temperature during the deposition. The IR peak positions indicate that the films consist mainly of alpha-phase CuPc, while the relative intensities suggest that the films are anisotropic. The anisotropic dielectric function for these CuPc layers was determined from ellipsometric spectra using uniaxial models in the range from 0.73 to 5eV. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：291 / 297

页数：7

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