Evaluating Carrier Accumulation in Degraded Bulk Heterojunction Organic Solar Cells by a Thermally Stimulated Current Technique

被引：116

作者：

Kawano, Kenji ^{[1
,2
]}

Adachi, Chihaya ^{[1
]}

机构：

[1] Kyushu Univ, Ctr Future Chem, Nishi Ku, Fukuoka 8190395, Japan

[2] Panason Elect Works Co Ltd, Adv Technol Dev Lab, Osaka 5718686, Japan

来源：

ADVANCED FUNCTIONAL MATERIALS | 2009年 / 19卷 / 24期

关键词：

OPEN-CIRCUIT VOLTAGE; LARGE-AREA; PHOTOVOLTAICS; DEGRADATION; EFFICIENCY; DEFECTS; NETWORK; DIODES;

D O I：

10.1002/adfm.200901573

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Here, the initial photo-degradation of encapsulated P3HT:PCBM bulk heterojunction organic solar cells is investigated. The degraded device is recovered by thermal annealing treatment. Thermally stimulated current measurements reveal that the cause of photo-degradation is carrier accumulation and that the degraded organic solar cell has two broad trap levels, of 0.71 and 0.81 eV. These traps are independent of the thickness of the photoactive layers, the mixing ratio of the photoactive materials and the cathode materials. In addition, it is confirmed that there is a close relationship between the degree of degradation and the amount of accumulated charge carriers.

引用

页码：3934 / 3940

页数：7

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