Controlled growth of O-polar ZnO epitaxial film by oxygen radical preconditioning of sapphire substrate

被引:39
作者
Mei, ZX
Wang, Y
Du, XL
Ying, MJ
Zeng, ZQ
Zheng, H
Jia, JF
Xue, QK
Zhang, Z
机构
[1] Chinese Acad Sci, Inst Phys, Beijing Natl Lab Electron Microscopy Condensed Ma, Beijing 100080, Peoples R China
[2] Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China
[3] Beijing Univ Technol, Beijing 100022, Peoples R China
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.1812362
中图分类号
O59 [应用物理学];
学科分类号
摘要
Oxygen radicals pregrowth treatment and surface nitridation were used to eliminate Zn-polar inversion domains and control the growth of single-domain O-polar ZnO film on sapphire (0001) substrate by rf plasma-assisted molecular beam epitaxy. We found that the formation of oxygen-terminated sapphire surface prior to nitridation is crucial for achieving the anion polarity in subsequent AlN and ZnO layers, as demonstrated by formation of the 3x3 surface reconstruction during ZnO growth and ex situ polarity determination. This method, in general, can be applied to growth of other polar films, such as II-VI oxides and III-V nitrides, on sapphire (0001) substrates. (C) 2004 American Institute of Physics.
引用
收藏
页码:7108 / 7111
页数:4
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