Advanced resist processing for thick photoresist applications

被引:1
作者
Cullmann, E
Loechel, B
Maciossek, A
Rothe, M
机构
[1] Karl Suss KG, D-85741 München-Garching
[2] Fraunhofer-Inst. S., D-14199 Berlin
关键词
Photoresists - Photolithography - Ultraviolet radiation - Electrodeposition - Stripping (removal) - Surface cleaning - Micromachining - Aspect ratio - Diffraction - Masks;
D O I
10.1016/0167-9317(95)00307-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Interest in thick photoresist applications is steadily growing. Specialised equipment has been developed to cope with the new challenges in the field of preparing extremely thick photoresist layers and the process to pattern these thick resists. A new technology called 30 UV-Microforming consisting of an advanced resist preparation process, UV lithographic steps, resist development, moulding procedures by electrodeposition, and finally stripping and cleaning for finishing the structures was developed. It enables the low-cost fabrication of a wide variety of micro components for many different users.
引用
收藏
页码:551 / 554
页数:4
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