Resonance enhancement of micromachined resonators with strong mechanical-coupling between two degrees of freedom

被引:35
作者
Li, XX
Ono, T
Lin, RM
Esashi, M
机构
[1] Chinese Acad Sci, Shanghai Inst Met, State Key Lab Transducer Technol, Shanghai 200050, Peoples R China
[2] Tohoku Univ, Venture Business Lab, Sendai, Miyagi 980, Japan
[3] Nanyang Technol Univ, Singapore 2263, Singapore
关键词
mechanical coupling; resonant amplitude; silicon cantilever; resonators;
D O I
10.1016/S0167-9317(02)00595-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A strong mechanical coupling scheme between two degrees of freedom (2-DOF) is proposed in this paper for resonance enhancement of silicon micromachined resonators. Two spring-mass-damping resonant units, with identical (or close) resonant frequency and great disparity in mass, are mechanically linked together to form a 2-DOF resonator. When the big unit (with bigger mass) is driven to resonate, a much-enlarged resonant amplitude of the small unit (with smaller mass) can be obtained, attributed to the strong mechanical coupling between the two units. PSPICE is used for simulation of the properties of the strong mechanical coupling effect. The simulation fairly verifies the mechanical coupling modeling of 2-DOF resonators and, furthermore, analyzes the effect of quality factor, which is dominated by damping, on the enlarged resonant amplitude, ratio of resonant amplitude between the two units, resonant frequency drift and resonant phase deviation. An ultra-thin silicon cantilever-shaped 2-DOF resonator consisting of a wide base-cantilever and a narrow working cantilever is fabricated with a high yield process. The 2-DOF resonator is driven in vacuum with incident laser light on the wide base cantilever. The resonant amplitude is detected with laser Doppler meter. Measurement results agree well with the strong mechanical coupling modeling of 2-DOF resonators. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1 / 12
页数:12
相关论文
共 10 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]  
ITOH T, 1997, 1997 INT C SOL STAT, P459
[3]   Vacuum encapsulation of resonant devices using permeable polysilicon [J].
Lebouitz, KS ;
Mazaheri, A ;
Howe, RT ;
Pisano, AP .
MEMS '99: TWELFTH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST, 1999, :470-475
[4]   ELECTROSTATICALLY DRIVEN VACUUM-ENCAPSULATED POLYSILICON RESONATORS .1. DESIGN AND FABRICATION [J].
LEGTENBERG, R ;
TILMANS, HAC .
SENSORS AND ACTUATORS A-PHYSICAL, 1994, 45 (01) :57-66
[5]  
MULHERN GT, 1993, 7 INT C SOL STAT SEN, P296
[6]  
Nguyen CTC, 1995, ULTRASON, P489, DOI 10.1109/ULTSYM.1995.495626
[7]  
ROUKES M, 2000, IEEE SOL STAT SENS A, P367
[8]  
Thomson WT, 1988, Theory of Vibration with Applications
[9]  
TODA R, 1997, 1997 INT C SOL STAT, P671
[10]   Mechanical behavior of ultrathin microcantilever [J].
Yang, JL ;
Ono, T ;
Esashi, M .
SENSORS AND ACTUATORS A-PHYSICAL, 2000, 82 (1-3) :102-107