In situ photoemission characterization of terminating-layer-controlled La0.6Sr0.4MnO3 thin films

被引：47

作者：

Kumigashira, H

Horiba, K

Ohguchi, H

Ono, K

Oshima, M

Nakagawa, N

Lippmaa, M

Kawasaki, M

Koinuma, H

机构：

[1] Univ Tokyo, Dept Appl Chem, Bunkyo Ku, Tokyo 1138656, Japan

[2] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2278581, Japan

[3] Tohoku Univ, Inst Mat Res, Sendai, Miyagi 980812, Japan

[4] Tokyo Inst Technol, Mat & Struct Lab, Yokohama, Kanagawa 2268503, Japan

[5] Combinatorial Mat Explorat & Technol, Tsukuba, Ibaraki 3050044, Japan

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 20期

关键词：

D O I：

10.1063/1.1575932

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on the fabrication of terminating-layer-controlled La0.6Sr0.4MnO3 (LSMO) thin films and in situ characterization of the films using photoemission spectroscopy. The terminating layer of the LSMO films was changed from B to A site by inserting one atomic layer of SrO between the LSMO film and a TiO2-terminated SrTiO3(001) substrate. The successful control of the terminating layer was confirmed by measuring the angular dependence of core-level spectra. Detailed analysis of the Sr 3d core levels revealed considerable differences in chemical bonding states of Sr atoms in the surface regions of films with different terminating layers. (C) 2003 American Institute of Physics.

引用

页码：3430 / 3432

页数：3

共 21 条

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