Removing drift from scanning probe microscope images of periodic samples

被引:37
作者
Woodward, JT [1 ]
Schwartz, DK [1 ]
机构
[1] Tulane Univ, Dept Chem, New Orleans, LA 70118 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 01期
关键词
D O I
10.1116/1.589834
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermal drift is frequently encountered when imaging with scanning probe microscopes. The drift skews real space images and distorts the reciprocal space lattice vectors. A settling time of up to 2 h is generally required to achieve relatively drift free images at the high magnifications needed for molecular or atomic resolution. We demonstrate a simple method to extract accurate lattice parameters from periodic samples which compensates for drift to first order (approximately constant drift rate), dramatically shortening the necessary waiting time. The method is based on averaging the apparent reciprocal lattice vectors corresponding to consecutive scans obtained in opposite scanning directions. (C) 1998 American Vacuum Society.
引用
收藏
页码:51 / 53
页数:3
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