共 21 条
[2]
Creep, hysteresis, and vibration compensation for piezoactuators: Atomic force microscopy application
[J].
JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME,
2001, 123 (01)
:35-43
[4]
Megahertz silicon atomic force microscopy (AFM) cantilever and high-speed readout in AFM-based recording
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2000, 18 (01)
:94-99
[7]
Knebel D, 1997, SCANNING, V19, P264, DOI 10.1002/sca.4950190403
[9]
STEP AND KINK DYNAMICS ON AU(110) AND PB(111) STUDIED WITH A HIGH-SPEED STM
[J].
PHYSICAL REVIEW B,
1995, 52 (15)
:11387-11397