Location specific in situ TEM straining specimens made using FIB

被引：25

作者：

Field, RD ^{[1
]}

Papin, PA ^{[1
]}

机构：

[1] Los Alamos Natl Lab Div, Los Alamos, NM 87545 USA

来源：

ULTRAMICROSCOPY | 2004年 / 102卷 / 01期

关键词：

in situ straining; transmission electron microscopy; focused ion beam;

D O I：

10.1016/j.ultramic.2004.08.002

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A method has been devised and demonstrated for producing in situ straining specimens for the transmission electron microscope (TEM) from specific locations in a sample using a dual-beam focused ion beam (FIB) instrument. The specimen is removed from a polished surface in the FIB using normal methods and then attached to a pre-fabricated substrate in the form of a modified TEM tensile specimen. In this manner, specific features of the microstructure of a polished optical mount can be selected for in situ tensile straining. With the use of electron backscattered diffraction (EBSD), this technique could be extended to select specific orientations of the specimen as well. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：23 / 26

页数：4