SIDE ENTRY SPECIMEN STAGES

被引：11

作者：

SWANN, PR

机构：

[1] Incorporated, Pittsburgh, Pennsylvania, 15 237

来源：

KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY | 1979年 / 14卷 / 10期

关键词：

D O I：

10.1002/crat.19790141013

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The basic concepts involved in the design of side entry specimen devices for performing in‐situ experiments are discussed. Examples of several working specimen stage designs are shown in which common experimental variables such as tilting, heating, cooling, straining and atmosphere control are used in various combinations. Copyright © 1979 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：1235 / 1243

页数：9

共 6 条

[1]

FLOWER HM, 1974, HIGH VOLTAGE ELECTRO, P383

[2] NOVEL SPECIMEN STAGE PERMITTING HIGH-RESOLUTION ELECTRON-MICROSCOPY AT LOW-TEMPERATURES [J].