Comparison of V2O5 xerogels prepared by the vanadate and alkoxide routes using X-ray absorption and other methods

被引:32
作者
Holland, GP
Huguenin, F
Torresi, RM
Buttry, DA [1 ]
机构
[1] Univ Wyoming, Dept Chem, Laramie, WY 82071 USA
[2] Univ Sao Paulo, Inst Quim Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil
[3] Univ Sao Paulo, Inst Quim, BR-05513970 Sao Paulo, Brazil
关键词
D O I
10.1149/1.1571534
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
X-ray absorption near edge spectroscopy (XANES), Brunauer-Emmett-Teller surface area, Fourier transform infrared (FTIR), and thermogravimetric analysis were used to characterize two xerogels of V2O5 prepared using the vanadate hydrolysis (i.e., the v-V2O5 material) or the vanadyl tris(isopropoxide) hydrolysis (i.e., the a-V2O5 material) synthetic routes. XANES spectra were obtained and analyzed for samples at varying degrees of lithiation that were either bathed in 0.5 M LiClO4/ propylene carbonate (PC) supporting electrolyte (i.e., in situ) or from which the solvent had been removed by treatment under high vacuum (i.e., ex situ), as judged by FTIR analysis. The pre-edge, main edge, and edge resonance peak intensities were examined to track the symmetry around the vanadium center. The results for the in situ samples made by both synthetic routes showed that the local symmetry around vanadium did not change significantly for x values ranging from 0 to 0.98, where x represents the degree of reduction in the formulation LixV2O5. For the ex situ samples, substantial distortion was observed on going from either the hydrated or PC-swollen states to states in which solvent was absent. Further, the XANES spectrum for an unlithiated ex situ a-V2O5 material showed very substantial distortion around vanadium compared to the v-V2O5 material, presumably due to the rapidity of polymerization in the alkoxide synthetic procedure. The galvanostatic intermittent titration technique was used to obtain the apparent Li+ diffusion coefficient in both materials, revealing Li+ diffusion in the v-V2O5 material that appeared to be more than two orders of magnitude faster than in the a-V2O5 material. The origin of that observation is discussed. (C) 2003 The Electrochemical Society.
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收藏
页码:A721 / A725
页数:5
相关论文
共 38 条
[21]   V2O5 XEROGEL FILMS AS INTERCALATION HOSTS FOR LITHIUM .1. INSERTION STOICHIOMETRY, SITE CONCENTRATION, AND SPECIFIC ENERGY [J].
PARK, HK ;
SMYRL, WH ;
WARD, MD .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (04) :1068-1073
[22]   XAS and electrochemical characterization of lithium intercalated V2O5 xerogels [J].
Passerini, S ;
Smyrl, WH ;
Berrettoni, M ;
Tossici, R ;
Rosolen, M ;
Marassi, R ;
Decker, F .
SOLID STATE IONICS, 1996, 90 (1-4) :5-14
[23]   ELECTROCHEMICAL PROPERTIES OF CATHODIC MATERIALS SYNTHESIZED BY LOW-TEMPERATURE TECHNIQUES [J].
PEREIRARAMOS, JP .
JOURNAL OF POWER SOURCES, 1995, 54 (01) :120-126
[24]  
PEREIRARAMOS JP, 1994, IND CHEM L, V5, P281
[25]   Structure of V2O5•nH2O xerogel solved by the atomic pair distribution function technique [J].
Petkov, V ;
Trikalitis, PN ;
Bozin, ES ;
Billinge, SJL ;
Vogt, T ;
Kanatzidis, MG .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2002, 124 (34) :10157-10162
[26]  
PROZET E, 1996, J CHEM SOC FARADAY T, V92, P103
[27]   WinXAS: A new software package not only for the analysis of energy-dispersive XAS data [J].
Ressler, T .
JOURNAL DE PHYSIQUE IV, 1997, 7 (C2) :269-270
[28]   EQCM measurements of solvent transport during Li+ intercalation in V2O5 xerogel films [J].
Shouji, E ;
Buttry, DA .
ELECTROCHIMICA ACTA, 2000, 45 (22-23) :3757-3764
[29]   Ex situ and in situ infrared spectroelectrochemical investigations of V2O5 crystalline films [J].
Surca, A ;
Orel, B ;
Drazic, G ;
Pihlar, B .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1999, 146 (01) :232-242
[30]   X-RAY ABSORPTION-SPECTROSCOPY (EXAFS XANES) EVIDENCE FOR THE PREFERENTIAL FORMATION OF ISOLATED VO4 SPECIES ON HIGHLY PHOTOACTIVE V2O5/SIO2 CATALYSTS [J].
TANAKA, T ;
NISHIMURA, Y ;
KAWASAKI, SI ;
FUNABIKI, T ;
YOSHIDA, S .
JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1987, (07) :506-508