Atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy

被引：169

作者：

D'Alfonso, A. J. ^{[1
]}

Freitag, B. ^{[2
]}

Klenov, D. ^{[2
]}

Allen, L. J. ^{[1
]}

机构：

[1] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia

[2] FEI Co, Eindhoven, Netherlands

来源：

PHYSICAL REVIEW B | 2010年 / 81卷 / 10期

基金：

澳大利亚研究理事会;

关键词：

TRANSMISSION ELECTRON-MICROSCOPE; STEM; EELS;

D O I：

10.1103/PhysRevB.81.100101

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We demonstrate atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy in scanning transmission electron microscopy. Theoretical simulations of the imaging process demonstrate that these images are directly interpretable. This is due to the fact that the effective ionization interaction is local and this is an incoherent mode of imaging.

引用

页数：4

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