Nanoimprint lithography at the 6 in. wafer scale

被引:86
作者
Heidari, B
Maximov, I
Montelius, L
机构
[1] Lund Univ, Div Solid State Phys, S-22100 Lund, Sweden
[2] Lund Univ, Nanometer Struct Consortium, S-22100 Lund, Sweden
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 06期
关键词
D O I
10.1116/1.1326923
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate: the nanoimprint lithography (NIL) technique with sub 100 nm resolution, on 6 in. Si substrates, The pattern transfer is performed using a specially designed NIL machine optimized to achieve a very high degree of parallelism between stamp and substrate. The stamp is made with the help of election beam lithography and Ni electroplating achieving features below 100 nm in size. The nanoimprint process is done in a single layer as well as in a multilayer resist scheme with subsequent O-2-plasma etching and metal lift-off. (C) 2000 American Vacuum Society. [S0734-211X(oo)18506-3].
引用
收藏
页码:3557 / 3560
页数:4
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