Rayleigh scattering, mode coupling, and optical loss in silicon microdisks

被引：124

作者：

Borselli, M ^{[1
]}

Srinivasan, K ^{[1
]}

Barclay, PE ^{[1
]}

Painter, O ^{[1
]}

机构：

[1] CALTECH, Dept Appl Phys, Pasadena, CA 91125 USA

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 17期

关键词：

D O I：

10.1063/1.1811378

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High refractive index contrast optical microdisk resonators fabricated from silicon-on-insulator wafers are studied using an external silica fiber taper waveguide as a wafer-scale optical probe. Measurements performed in the 1500 nm wavelength band show that these silicon microdisks can support whispering-gallery modes with quality factors as high as 5.2x10(5), limited by Rayleigh scattering from fabrication induced surface roughness. Microdisks with radii as small as 2.5 mum are studied, with measured quality factors as high as 4.7x10(5) for an optical mode volume of 5.3 (lambda/n)(3). (C) 2004 American Institute of Physics.

引用

页码：3693 / 3695

页数：3

共 19 条

[1] Strong-coupling regime for quantum boxes in pillar microcavities:: Theory [J].