Microstructural gradients in thin hard coatings - tailor-made

被引:7
作者
Fischer, K [1 ]
Oettel, H [1 ]
机构
[1] Freiberg Univ Min & Technol, Inst Phys Met, D-09596 Freiberg, Germany
关键词
TiN coatings; reactive magnetron sputtering; texture gradients; residual stress gradients; thin film growth;
D O I
10.1016/S0257-8972(97)00377-0
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Microstructural modifications resulting from time dependent variations of the bias voltage during the deposition of thin hard coatings are discussed. TiN-coatings are produced by reactive magnetron sputtering in several modes: (a) stepwise increase of the bias voltage during the deposition, (b) alternating sputtering with and without substrate voltage and (c) pulsed bias voltage. On the basis of X-ray diffraction measurements, it is demonstrated that residual stress gradients and texture gradients can be designed tailor-made. Furthermore, results of microhardness measurements and scratch tests indicate an improvement of the mechanical properties, especially for the application of a pulsed bias voltage. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:308 / 312
页数:5
相关论文
共 14 条
[1]   RESIDUAL-STRESS IN ION-ASSISTED COATINGS [J].
BULL, SJ ;
JONES, AM ;
MCCABE, AR .
SURFACE & COATINGS TECHNOLOGY, 1992, 54 (1-3) :173-179
[2]   Analysis of residual stress gradients in thin films using SEEMANN-BOHLIN-X-ray diffraction [J].
Fischer, K ;
Oettel, H .
EUROPEAN POWDER DIFFRACTION: EPDIC IV, PTS 1 AND 2, 1996, 228 :301-306
[3]  
FISCHER K, 1997, IN PRESS PRAKT METAL
[4]  
FISCHER K, 1997, P WERKST 96 FRANKF, P799
[5]  
FISCHER K, 1997, THESIS FREIBERG U MI
[6]  
KIRSTEN A, 1993, MITTEIL, V48, P324
[7]  
KIRSTEN A, 1993, HARTEREITECHN MITTEI, V48, P324
[8]   ELASTIC-PLASTIC INDENTATION DAMAGE IN CERAMICS - THE MEDIAN-RADIAL CRACK SYSTEM [J].
LAWN, BR ;
EVANS, AG ;
MARSHALL, DB .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1980, 63 (9-10) :574-581
[9]   Residual stresses in PVD hard coatings [J].
Oettel, H. ;
Wiedemann, R. .
Surface and Coatings Technology, 1995, 76-77 (1 -3 pt 1) :265-273
[10]   SEEMANN-BOHLIN X-RAY DIFFRACTOMETRY .I. INSTRUMENTATION [J].
PARRISH, W ;
MACK, M .
ACTA CRYSTALLOGRAPHICA, 1967, 23 :687-&