TiN coatings;
reactive magnetron sputtering;
texture gradients;
residual stress gradients;
thin film growth;
D O I:
10.1016/S0257-8972(97)00377-0
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Microstructural modifications resulting from time dependent variations of the bias voltage during the deposition of thin hard coatings are discussed. TiN-coatings are produced by reactive magnetron sputtering in several modes: (a) stepwise increase of the bias voltage during the deposition, (b) alternating sputtering with and without substrate voltage and (c) pulsed bias voltage. On the basis of X-ray diffraction measurements, it is demonstrated that residual stress gradients and texture gradients can be designed tailor-made. Furthermore, results of microhardness measurements and scratch tests indicate an improvement of the mechanical properties, especially for the application of a pulsed bias voltage. (C) 1997 Elsevier Science S.A.