A compact analytical model for asymmetric single-electron tunneling transistors

被引:80
作者
Inokawa, H [1 ]
Takahashi, Y [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Kanagawa 2430198, Japan
关键词
asymmetric SETT; compact modeling; Coulomb staircase; input capacitance; master equation; single-electron tunneling transistor (SETT);
D O I
10.1109/TED.2002.808554
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Analytical model for asymmetric single-electron tunneling transistors (SETTs), in which, resistance and capacitance parameters of source/drain junctions are not equal, has been developed. The model is based on-the steady-state master equation, takes only the two most-probable charging states into account, and is therefore very simple. Even so, it can accurately reproduce the peculiar behaviors of an asymmetric SETT, such as the skew in the drain current-gate voltage characteristics and the Coulomb staircase in the drain current-drain voltage characteristic. Analytical expressions for the charge in. the Coulomb island and the capacitance components of the SETT are also derived according to the same scheme, and it is demonstrated that the model can precisely describe the various aspects of the SETT behavior.
引用
收藏
页码:455 / 461
页数:7
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