Degree of polarization as an objective method of estimating scattering

被引:23
作者
Bueno, JM
Berrio, E
Ozolinsh, M
Artal, P
机构
[1] Univ Murcia, Dept Fis, Lab Opt, E-30071 Murcia, Spain
[2] Latvian State Univ, Inst Solid State Phys, LV-1063 Riga, Latvia
关键词
D O I
10.1364/JOSAA.21.001316
中图分类号
O43 [光学];
学科分类号
070207 [光学]; 0803 [光学工程];
摘要
A new method of determining objectively the amount of scattered light in an optical system has been developed. It is based on measuring the degree of polarization of the light in images formed after a double pass through the system. A dual apparatus composed of a modified double-pass imaging polarimeter and a wavefront sensor was used to measure polarization properties and aberrations of the system under test. We studied the accuracy of the procedure in a system that included a lanthanum-modified lead zirconate titanate (PLZT) ceramic plate able to generate variable amounts of scattered light as a function of the applied voltage. Changes in the voltage applied to the ceramics plate modified significantly the scattering contribution while hardly altering the wave-front aberration. The degree of polarization was well correlated with the level of scattering in the system as determined by direct-intensity measurements at the tails of the double-pass images. This indicates that this polarimetric parameter provides accurate relative estimates of the amount of scattering generated in a system. The technique can be used in a number of applications, for example, to determine objectively the amount of scattered light in the human eye. (C) 2004 Optical Society of America.
引用
收藏
页码:1316 / 1321
页数:6
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