An adaptive level-selecting wavelet transform for texture defect detection

被引:79
作者
Han, Yanfang [1 ]
Shi, Pengfei
机构
[1] Shanghai Univ Sci & Technol, Inst Informat & Commun Engn, Shanghai 200030, Peoples R China
[2] Shanghai Jiao Tong Univ, Inst Image Proc & Pattern Recognit, Shanghai 200030, Peoples R China
关键词
wavelet transform; co-occurrence matrix; defect detection; texture image processing;
D O I
10.1016/j.imavis.2006.07.028
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
We present an effective approach based on wavelet transform (WT) to detect defects on images with high frequency texture background. The original image is decomposed at various levels by WT. Then, by selecting an appropriate level at which the approximation sub-image is reconstructed, textures on the background are effectively removed. Thus, the difficult texture defect detection problem can be settled by non-texture techniques. An adaptive level-selecting scheme is presented by analyzing the co-occurrence matrices (COM) of the approximation sub-images. Experiments are done to detect the stains and broken points on texture surfaces. Comparisons with frequency domain low and high pass filters show that our method is much more effective. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1239 / 1248
页数:10
相关论文
共 22 条
[1]   An efficient texture classification algorithm using Gabor wavelet [J].
Ahmadian, A ;
Mostafa, A .
PROCEEDINGS OF THE 25TH ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY, VOLS 1-4: A NEW BEGINNING FOR HUMAN HEALTH, 2003, 25 :930-933
[2]   Texture defect detection using subband domain co-occurence matrices [J].
Amet, AL ;
Ertuzun, A ;
Ercil, A .
1998 IEEE SOUTHWEST SYMPOSIUM ON IMAGE ANALYSIS AND INTERPRETATION, 1998, :205-210
[3]  
AMON G, 2004, SIGNAL PROCESS, V84, P1225
[4]  
[Anonymous], IEEE T IMAGE PROCESS, DOI DOI 10.1109/83.753747
[5]  
[Anonymous], IMAGE MODELING
[6]   Texture segmentation using wavelet transform [J].
Arivazhagan, S ;
Ganesan, L .
PATTERN RECOGNITION LETTERS, 2003, 24 (16) :3197-3203
[7]  
Bodnarova A, 1997, TENCON IEEE REGION, P307, DOI 10.1109/TENCON.1997.647318
[8]   Fabric defect detection by Fourier analysis [J].
Chan, CH ;
Pang, GKH .
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2000, 36 (05) :1267-1276
[9]   Mean shift: A robust approach toward feature space analysis [J].
Comaniciu, D ;
Meer, P .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2002, 24 (05) :603-619
[10]   ORTHONORMAL BASES OF COMPACTLY SUPPORTED WAVELETS [J].
DAUBECHIES, I .
COMMUNICATIONS ON PURE AND APPLIED MATHEMATICS, 1988, 41 (07) :909-996