Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS

被引：37

作者：

Bailey, M. J. ^{[1
]}

Jones, B. N. ^{[1
]}

Hinder, S. ^{[2
]}

Watts, J. ^{[2
]}

Bleay, S. ^{[3
]}

Webb, R. P. ^{[1
]}

机构：

[1] Univ Surrey, Ion Beam Ctr, Surrey GU2 7XH, England

[2] Univ Surrey, Surface Anal Lab, Surrey GU2 7XH, England

[3] Home Off Sci Dev Branch, St Albans, Herts, England

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2010年 / 268卷 / 11-12期

基金：

英国工程与自然科学研究理事会;

关键词：

Secondary in mass spectrometry; Fingerprints; Forensic Science; Ion Beam Analysis;

D O I：

10.1016/j.nimb.2010.02.104

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Police institutions currently have no analytical method of knowing whether a fingerprint was deposited before Or after the document was written or printed. The suitability of using MeV secondary ion mass spectrometry (i.e. SIMS with an MeV ion beam) to determine the order in which a fingerprint and written text were deposited on paper was therefore investigated. A 10 MeV O(4+) beam was used to generate secondary ions from the surface of the samples and to map the molecular fragments from doped fingerprints and inks on paper. The images obtained and the sputtering behaviour of the samples was found to be indicative of the sequence of ink and fingerprint deposits. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：1929 / 1932

页数：4

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