Performance and testing of thermal interface materials

被引:288
作者
Gwinn, JP [1 ]
Webb, RL [1 ]
机构
[1] Penn State Univ, Dept Mech Engn, University Pk, PA 16802 USA
关键词
thermal interface material; thermal interface resistance; contact resistance; electronics cooling;
D O I
10.1016/S0026-2692(02)00191-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The increasing power and reduced die size of CPUs used in computers increases a need for significantly improved thermal interface materials (TIM). The TIM is used to reduce contact resistance at the CPU-heat sink interface. This work provides a state-of-the-art assessment on 'thermal interface materials', including fundamentals, materials used, their performance, and how interface resistance is measured. The performance of new commercial interface materials is given, as well as discussion of the advantages and disadvantages of different materials. The report notes that the recommended interface test method does not necessarily duplicate the installation and operating conditions in an actual computer installation. Recommendations are presented on the design and operation of an apparatus intended to simulate actual computer installation conditions. The innovative Penn State 'low melting point alloy' thermal interface material is described and compared to other commercial materials. (C) 2003 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:215 / 222
页数:8
相关论文
共 21 条
[1]  
Chiu CP, 2000, INTERNATIONAL SYMPOSIUM ON ADVANCED PACKAGING MATERIALS: PROCESSES, PROPERTIES AND INTERFACES, PROCEEDINGS, P265
[2]  
CHU CP, 1997, P 13 IEEE SEMI THERM, V1, P57
[3]   A NOVEL CONCEPT FOR REDUCING THERMAL CONTACT RESISTANCE [J].
COOK, RS ;
TOKEN, KH ;
CALKINS, RL .
JOURNAL OF SPACECRAFT AND ROCKETS, 1984, 21 (01) :122-124
[4]  
DESORGO M, 2001, COMMUNICATION 1008
[5]  
DESORGO M, 1996, ELECT COOL, V2
[6]  
EATON M, 2001, THERMAL RESISTANCE T
[7]   Apparatus for accurate measurement of interface resistance of high performance thermal interface materials [J].
Gwinn, JP ;
Saini, M ;
Webb, RL .
ITHERM 2002: EIGHTH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS, PROCEEDINGS, 2002, :644-650
[8]  
GWINN JP, 2002, P ITHERM, P671
[9]  
HOUSE N, 2001, THERMAL INTERFACE BA
[10]  
HOUSE N, 2001, COMMUNICATION JUL