Quantum noise in the Josephson charge qubit

被引：251

作者：

Astafiev, O ^{[1
]}

Pashkin, YA

Nakamura, Y

Yamamoto, T

Tsai, JS

机构：

[1] RIKEN, Inst Phys & Chem Res, Wako, Saitama 3510198, Japan

[2] NEC Fundamental & Environm Res Labs, Tsukuba, Ibaraki 3058501, Japan

来源：

PHYSICAL REVIEW LETTERS | 2004年 / 93卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.93.267007

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We study decoherence of the Josephson charge qubit by measuring energy relaxation and dephasing with help of the single-shot readout. We found that the dominant energy relaxation process is a spontaneous emission induced by quantum noise coupled to the charge degree of freedom. Spectral density of the noise at high frequencies is roughly proportional to the qubit excitation energy.

引用

页数：4

共 23 条

[1] Single-shot measurement of the Josephson charge qubit [J].

Astafiev, O ;

Pashkin, YA ;

Yamamoto, T ;

Nakamura, Y ;

Tsai, JS .

PHYSICAL REVIEW B, 2004, 69 (18) :180507-1

[2]

Averin DV, 2000, FORTSCHR PHYS, V48, P1055, DOI 10.1002/1521-3978(200009)48:9/11<1055::AID-PROP1055>3.0.CO

[3]

2-1

[4] Coherent quantum dynamics of a superconducting flux qubit [J].

Chiorescu, I ;

Nakamura, Y ;

Harmans, CJPM ;

Mooij, JE .

SCIENCE, 2003, 299 (5614) :1869-1871

[5] Detection of quantum noise from an electrically driven two-level system [J].

Deblock, R ;

Onac, E ;

Gurevich, L ;

Kouwenhoven, LP .

SCIENCE, 2003, 301 (5630) :203-206

[6] Coherent dynamics of a Josephson charge qubit [J].

Duty, T ;

Gunnarsson, D ;

Bladh, K ;

Delsing, P .

PHYSICAL REVIEW B, 2004, 69 (14) :140503-1

[7] OBSERVATION OF COMBINED JOSEPHSON AND CHARGING EFFECTS IN SMALL TUNNEL JUNCTION CIRCUITS [J].

FULTON, TA ;

GAMMEL, PL ;

BISHOP, DJ ;

DUNKLEBERGER, LN ;

DOLAN, GJ .

PHYSICAL REVIEW LETTERS, 1989, 63 (12) :1307-1310

[8] Temperature dependence of low-frequency noise in Al-Al2O3-Al single-electron transistors [J].

Kenyon, M ;

Lobb, CJ ;

Wellstood, FC .

JOURNAL OF APPLIED PHYSICS, 2000, 88 (11) :6536-6540

[9]

KOGAN S, 1996, ELECT NOISE FLUCTUAT, P62

[10] Measurement of the excited-state lifetime of a microelectronic circuit [J].

Lehnert, KW ;

Bladh, K ;

Spietz, LF ;

Gunnarsson, D ;

Schuster, DI ;

Delsing, P ;

Schoelkopf, RJ .

PHYSICAL REVIEW LETTERS, 2003, 90 (02) :4-027002

← 1 2 3 →